Backplane/Chassis Test Solutions W 3504

The W 3504 and W 3525 Test Systems are perfectly designed to test from medium-sized to really huge backplanes and racks. They manage the testing of a huge number of connections within a really short time period—with up to 300,000 test points.The integration of test points into mobile daisy-chain cartridges avoids complicated and error-prone adaption and shows a higher accuracy. It also enables a faster, automatable contacting and leads to a higher throughput.

W Test & Measurement Performance
Maximum Voltage of 40 VDC (12-Bit Resolution)
Constant Current of 1 mA, 10 mA, or 100 mA
Continuity Thresholds down to 0.3 Ohms (± 2% ± 0.15 Ohms)
Insulation Threshold up to 10 MOhm (± 1%), up to 40 MOhms (± 3%)
Resistor Test from 0.3 Ohms to 40 MOhms (± 3% ± 0.15 Ohms)
Capacitor Test from 20 nF to 40,000 µF (± 10% ± 10 nF)
Diode and Zener Diode Test for Open, Short and Reversed Insertion
Function Test of Keys and Switches

Hardware
Daisy Chain Cassettes Populated with Plug-In Transistor Test Point Modules as Required for the Pin Count of the Target Connector
External Modules with 32, 128, 192 or 256 Test Points
PCI Interface for Connection to a PC (Includes Interface Cable)
Expandable to 307,200 Test Points
Optional Remote Control Interface for Driving Peripheral Devices (Fixtures, 
Feeders, etc.)

Dimensions & Weight
19-inch Rack-Mount Enclosure on Wheels
21.7 x 19.7 x 23.6 inches (x D x H)
110 lbs

 Highlights
• Fast test speed and at the same time optimized accuracy
• Highly variable during configuration of the test system
• Ideal customization to an existing manufacturing system

Fast test speed and a the same time optimized accuracy
• Quick test times through single transistors (single point switching matrix)
• Highly accurate through minimization of adaption cables and the number of plug connectors between test points and the unit under test (UUT)