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Home » Products » EM TEST » Voltage Surge Generators »

8kV Combination Wave Simulator

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8kV Combination Wave Simulator

  • VCS 500N8-8kV Combination Wave Simulator

Model : VCS 500N8

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  • VCS 500N8
  • Description
  • Specifications
  • Features
  • Applications

Combination Wave Simulator

Surge pulses occur due to direct or indirect lightning strokes to an external (outdoor) circuit. This leads to currents or electromagnetic fields causing high voltage or current transients. Another source for surge pulses are switching transients originating from switching disturbances and systems faults.

Due to the characteristic of the phenomenon nearly every electrical and electronical device may suffer from such lightning events which justifies the necessity of surge tests being widely performed. Surge voltage can reach several thousands of volts and surge current is seen to reach several thousands of amps.


  • Surge voltage up to 8kV
  • Surge current up to 4kA
  • Voltage/current monitors
  • Built-in CDN 1-phase or 3-phase up to 3 x 690V and 32A
  • Interlock
  • Warning lamp control
  • Manual operation
  • USB (optical link) and GPIB interface

Benefits

VCS 500N8 - Compact combination wave simulator with integrated CDN

Although generating voltages as high as 8kV the VCS 500N8 offers a integrated coupling/decoupling network either single phase or three-phase with a nominal current of 16A per phase. In case higher current is required its capability can be extended by an external CDN to achieve nominal currents of 100A and more per phase.

By selecting the desired coupling the source impedance and the coupling capacitor is set automatically what ever CDN is connected.

Fail inputs are offered as standard for DUT monitoring purposes. Peak values of voltage and current are shown in the display and these values are transferred to the software for reporting.

To comply with safety regulations the VCS 500N8 is equiped with a contact to control warning lamps and with a safety interlock.

Pre-programmed Standard Test routines allow highest user convenience. Still the VCS 500N8 offers the Quick Start test routine where parameters can be changed on-line during the test to evaluate the susceptibility level of an individual DUT.

Operation
Easy to operate

Front panel menu and function keys enable the user to program his test routines quickly and accurately. The cursor allows fast control of all test parameters of the programmed routine, thus test procedures are simplified and confidence is generated that every step is carried out correctly.





Software
iec.control Software for control and documentation

Outstanding user convenience, clearly structured windows and operation features and the EM TEST standards library along with the flexibility to generate user specific test sequences very easily are the main features of iec.control software. The software is automatically configured according to the connected EM TEST generators.

Extensive reporting capabilities help the user to create test reports that meet international requirements.

iec.control is supported by Windows 2000, Windows XP, Windows Vista and Windows 7. Remote control is achieved either via USB or GPIB. iec.control supports a wide range of GPIB cards of National Instruments.

Auxiliary Devices
CNV 503 - 3phase coupling/decoupling networks for surge

EM TEST offers a range of fully automatic 3phase coupling/decoupling networks for surge to extend the test capability for three-phase DUTs. The networks have a rated current of up to 100A.

CNI 503 - 3phase coupling/decoupling networks for burst and surge

EM TEST offers a range of fully automatic 3phase coupling/decoupling networks for burst and surge to extend the test capability for three-phase DUTs. The networks have a rated current of up to 100A.

CNV 504N/508N - Surge coupling/decoupling networks for signal/data lines

CNV 504N/508N coupling/decoupling networks are available to perform surge tests on I/O lines, signal/data lines and telecom lines as per IEC 61000-4-5.

Accessories
MS 100N - Magnetic field coil

By means of the MS 100N magnetic field coil of EM TEST pulsed magnetic fields as per IEC/EN 61000-4-9 and related standards can be generated.

EN 61000-4-5
EN 61000-4-9
IEC 60255-22-5
IEC 61000-4-5
IEC 61000-4-9
IEC 61326
IEC 61850-3
ITU-T K.12
ITU-T K.20
ITU-T K.45

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